WAFER CHUCK PULL-OUT FEATURE:
ALLOWING CONVENIENTAND SAFE WAFER EXCHANGE
WITH 12 INCHES OF UNOBSTRUCTED ACCESS.
INCLUDING A ERGONOMIC HANDLE DESIGN WITH
REPEATABLE MECHANICAL TRIGGER RELEASE/LOCK
AND A HEAVY DUTY PRECISION BEARING GUIDE SYSTEM.
PLATEN TWO POSITION FAST Z ,GAS SHOCK ASSISTED
MECHANICAL PLATEN LIFT SYSTEM:
MICROSCOPE LIFT DELAY WITH ADJUSTABLE OFFSET.
AVOIDING MICROSCOPE OBJECTIVE INTERFERENCE
WITH PROBE CARDS AND PROBES DURING THELOADING
AND UNLOADING Of WAFERS.
PLATEN COOLING
AIR COOLED TO REDUCE PROBE DRIFT CAUSED
BY HIGH TEMPERATURE TESTING
INTEGRATED VIBRATION ISOLATION TABLE
PLATFORM WITH ADJUSTABLE CASTERS AND
JOY STICK
INTELLIGENT MOTOR
310mm X-Y STAGE DRIVE WITH SUB MICRON
RESOLUTION.
Copyright
2004 by Probing Solutions, Inc.
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